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USM-SPE Electron Spectromicroscope
• Identifies elemental composition, chemical states, and relative component concentrations on solid material surfaces.
• Enables detailed investigation of surface physicochemical properties.
• Real-space imaging provides two-dimensional elemental and chemical-state mapping with high spatial resolution.
• Momentum-space imaging directly reveals electronic band structures for in-depth analysis of material properties.
• Supports research and applications in Metals, Organic molecules, Semiconductors, Nanomaterials, Biomaterials, and Catalysis.
Specifications
| Specifications | |
|---|---|
| light Source | X-ray / UV laser / Pulsed laser |
| Resolution |
Spatial: ≤30 nm (nac)；≤10nm (ac) Momentum: ≤ 0.01 Å-1 Electronic energy: ≤ 100 meV |
| Field of view |
Spatial: 1 μm – 200 μm Momentum: 0.5 – 6.0 Å-1 |
| Sample Temperature |
RT – 2000 K 10 K – RT (optional) |
| Base Vacuum | ≤ 5×10-10 mbar (main chamber) |
Imaging mode and mechanism
| Measurement Modes |
|---|
| BF-PEEM |
| DF-PEEM |
| XPEEM |
| (X)MCD, (X)MLD |
| ARPES / µARPES |
| TR-PEEM |
| Information |
|---|
| Work function / Photoemission yield |
| Momentum-selected band structure |
| Chemical composition |
| Magnetism |
| Electronic structure |
| Ultrafast dynamics |
| Application scenarios：Momentum Photoelectron Spectroscopy: ARPES |
| Application scenarios：High Resolution XPS Imaging |
| Application scenarios：High Temporal Resolution Charge and Carrier Dynamics |